The High-End, Easy-to-Use EBSD Analysis System
Bruker's QUANTAX EBSD analysis system provides the analyst with an easy to use and advanced tool for EBSD measurement and evaluation. The system can also be used in conjunction with the QUANTAX EDS system creating the most advanced integrated EBSD/EDS system, supported by the ESPRIT 2 software under a single user interface.
In-situ vertically adjustable e-Flash EBSD detector series for maximum analytical flexibility, now includes the ARGUS™ forescattered/backscattered electron imaging system
Fast acquisition with 630 patterns/s (4x4 binning) or 930 patterns/s (8x8 binning) using the e-Flash1000 detector
High resolution pattern acquisition with the e-FlashHR, providing pattern images of up to 1600x1200 pixels and an acquisition speed of 140 patterns/s (10x10 binning) and 170 patterns/s (20x20 binning). It supports measurements at low acceleration voltages (down to 5 kV) and low beam currents (down to 0.1 nA).
Signal assistant for acquisition setup
Calibration assistant for geometrical setup
Point inspector for checking data quality
Band positions are saved
Band detection and indexing with up to 3,000 patterns/s
Fast re-indexing with up to 54,000 points/s
Advanced phase ID
Offline phase ID
EDS-assisted phase discrimination
LED detector position indicator and multiple features for safe operation
Fully software controlled detector with all electronics integrated
Simultaneous EBSD and EDS acquisition at up to 930 patterns/s, supported by in-situ tilt feature to optimally position both detectors
Easy-to-use EBSD software with a single user interface
Individual settings can be stored in a personal user profile
Transmission Kikuchi Diffraction
QUANTAX EBSD is available with unequaled support for Transmission Kikuchi Diffraction (TKD) analysis through the OPTIMUS™ TKD detector head and the TKD toolkit. The ESPRIT 2 software features TKD support as well.