Upgrading SEMs for Trace Element Analysis
QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.
The user friendly Micro-XRF system for SEM
Distribution analysis with HyperMap stores complete spectra for every map point for on- and offline analysis
Samples can be analyzed with Micro-XRF and EDS without position change
Both methods are integrated in the same analytical software suite - ESPRIT 2.0
No interference with normal SEM operation, XTrace can stay in its measurement position most of the time.
A complete micro-XRF spectrometer without the investment
Analytical results compare to those of standalone systems
Image tiling allows mapping large areas
Selectable primary radiation filters to suppress diffraction peaks
Uses the SEM motorized stage
Allows sample tilt to produce minimum spot sizes.