The VIEW MicroLine 300 from QVI is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices. This capable desktop instrument provides precises automated field-of-view measurement of features ranging in size from 0.65 µm to 400 µm on parts up to 200 mm.
- Motorized autofocus for optimum image quality
- Programmable light intensity
- Robust capabilities for measuring transparent layers, lines eith irregular edges and more.