Failure Analysis,
Material Characterization
and Metrology Equipment

Scanning Electron Microscopes, Transmission Electron Microscopes, Atomic Force Microscopes, Raman Microscopes, Thermal Analyzers, FTIR, Failure Analysis Systems, Sample Preparation Equipment, Scanning Acoustic Microscopes, Optical Microscopes, X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and more.

Failure Analysis, Material Characterization and Metrology Equipment

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STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.
Hitachi’s DMA is the perfect tool for assessing both stiff and soft samples, while also capturing rapid modulus changes.

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failure analysis, material characterization, and metrology equipment

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