Failure Analysis Systems

Hamamatsu Thermal F1 Emission microscope

Thermal F1

Emission microscope

The "Thermal F1" is the next generation in thermal emission microscopy. Completely redesigned from the ground up by the same engineers responsible for the PHEMOS, the F1 features an automated microscope stage, best-in-class sensitivity...

Hamamatsu PHEMOS-1000 Emission microscope

PHEMOS-1000

Emission microscope

The PHEMOS-1000 is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by semiconductor device defects.

Hamamatsu iPHEMOS-MP Inverted Emission Microscope

iPHEMOS-MP

Inverted Emission Microscope

The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.

Hamamatsu iPHEMOS-DD Inverted Emission Microscope

iPHEMOS-DD

Inverted emission microscope

The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.

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