Hitachi Nano-Prober​ NP6800​ SEM Probing System – Sigmatech inc. Philippines
The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond.
The iPHEMOS-DD superimposes the emission image on a high-resolution pattern image to localize defect points quickly. The contrast enhancement function makes an image clearer and more detailed.
Display function
Line voltage | AC 200 V (50 Hz/60 Hz) |
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Power consumption | Approx. 1400 VA (Max. 3300 VA) |
Vacuum | Approx. 80 kPa or more |
Compressed air | 0.5 MPa to 0.7 MPa |
Dimensions/Weights | Main unit: 1980 mm (W)×1270 mm (D)×834 mm (H), Approx. 1700 kg Control rack: 880 mm (W)×700 mm (D)×1842 mm (H), Approx. 300 kg Optional desk: 1400 mm (W)×800 mm (D)×700 mm (H), Approx. 60 kg |
The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond.
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You may contact our specialists by accomplishing form below.
You may contact our specialists by accomplishing form below.