Hamamatsu PHEMOS-X Emission Microscope
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
If the analytical question is not a standard method, appears difficult, or requires special sample handling, AC PAC is your best partner.
The LI-870 CO2/H2O Analyzer is a versatile analyzer for publication quality data that is simple to deploy, use, and maintain.
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
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