Hamamatsu PHEMOS-X Emission Microscope
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
1. Color LCD touch panel
Large sized color graphics LCD displays real-time titration curves and differential curves to show reaction tendencies, etc. All information is easily viewed.
2. USB flash memory stick port
The titration results and titration conditions including titration/differential curve data can be stored on a USB JumpDrive. To edit and view the data stored in the USB, an optional software“Titra-Net Viewer” is necessary.
3. Browse results on a PC in a LAN connection
Results data and curves can be displayed on a PC with no optional software.
4. GLP correspondent functions to support reliability of the titration results
Buret precision test, electrode calibration, reagent remaining volume indication, and other useful functions for maintenance.
5. Different titrations can run in parallel at the same time!
(Option parts)
Up to four titration stations are available.
6. Password Control and User Authority
Setting password administration allows setting the authority of operation limits for each user. User authority is selected from “Administrator ” and “Limited “. The one can operate all function and the other operate limited function.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
A new type of MESA-50 XRF with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
In-line automatic inspection equipment for electronic board X-ray inspection.
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