The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
- HIGH MILLING RATE
- Improved cross-section milling rate by PLUS-II ion gun.
- Wider-area fabrication can be achieved in a short time by combining with wide-area cross-section milling.
- HYBRID MILLING
- Hybrid model with cross-section milling and flat milling.
- WIDE-AREA CROSS-SECTION MILLING
- EASY TO OPERATE