SU3800 / SU3900 VP SEM

Performance & Power in a Flexible Platform

Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability.

The operator can automate many operations and efficiently utilize their high performance.

The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

 

Feature:

  • Up to 300,000x Magnification for image and up to 800,000x magnification for display
  • Can mix images with overlap of Backscattered Electron (BSE) and Secondary Electron (SE) detectors
  • Segmented Backscattered Electron detection imaging allows for visualizing composition and topography
  • 300mm diameter for maximum specimen size
  • Optional Specimen Exchange Chamber for faster and safer specimen exchange sequence
  • Optional Multi Zigzag function for large area or multiple areas
  • Easy operation and easy maintenance
 
 
 
 

 

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