Both NEXTA DSC600 and DSC200 use an advanced heat-flow design in the sensor. This allows the heat from the heat sink transferred evenly to the sample and the reference, resulting in the high baseline stability. Together with a furnace built with a low-heat-capacity three-layered insulation design, this allows the NEXTA DSC achieves world-class baseline repeatability and stability.
The NEXTA DSC600 has a proprietary thermopile-type DSC sensor. By using differential scanning calorimetry (DSC signal) temperature sensor thermocouples connected in series and multiplexed, the NEXTA DSCs achieve a high sensitivity of 0.1 µW or lower, enabling measurement of even smaller samples.
The Real View Sample Observation Unit has a built-in two-megapixel high-resolution camera that supports visual observation of the sample. The viewport (observation window) has a heating mechanism that extends the measurement range from the conventionally observable range of room temperature and above down to the low temperature of -50°C. This enables the user to observe processes such as the crystallization and the glass transition, for example, of samples at low temperatures. This offers a unique capability for understanding material behavior.
The reversing heat flow (which shows glass transition and melting) and non-reversing heat flow (which shows enthalpy relaxation, curing, evaporation, decomposition, etc) are obtained from a modulated DSC measurement. This is useful when these transitions or reactions overlap or stress relief obscures a transition. The modulated DSC method can also be used for determining the specific heat capacity (Cp), which simplifies measuring Cp.
See product on hitachi’s website
Suitable for multi-layer sequential sputtering of two materials, the Q300T D Plus has two independent sputtering heads, which allows sequential sputtering of two metals without the need to break vacuum.
The LI-250A is a portable meter that displays the output from any LI-COR light meter that has a cable terminated with a BNC connector. It shows instantaneous values or 15-second averages of values from a sensor.
The VIEW MicroLine® Metrology Systems is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW line. Its high performance and compact footprint make it VIEW’s most popular model.
You may contact our specialists by accomplishing form below.
You may contact our specialists by accomplishing form below.
