The FlexSEM 1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations.
Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm.
The electron optics incorporate a low aberration objective lens and a unique gun bias system that allows delivery of high emission current.
Accelerating Voltage: 20 kV
Secondary Electron (SE) Image
Magnification: 60,000X
Resolution: 4.0 nm
Accelerating Voltage: 20 kV
Backscattered Electron (BSE) Image
Magnification: 50,000X
Resolution: 5.0 nm
Novel low vacuum technologies enable observation of the surface of non-conductive specimens without preprocessing, across the entire pressure and accelerating voltage ranges.
The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience level. A touch panel operation is possible.
SEM MAP helps to locate regions of interest quickly, and delivers accurate correlated optical and SEM images using only one click. Optical and EM correlation function, SEM MAP is fully integrated into the graphical user interface.
A compact design (450 mm wide) minimizes system footprint. The FlexSEM is designed with separable units for flexible system placement. The entire system requires only a standard wall outlet for power.
FlexSEM 1000 II
The newly developed electron optical column and Ultra-Variable-Pressure Detector (UVD) enable superior imaging of specimen surfaces at low-accelerating-voltages and low-vacuum conditions.
Sample: Functional Resin Fracture
Vacc: 5 kV; Mag: 5,000X
Pressure: 50 Pa; Signal: UVD
Sample: Pyrite Fracture Surface
Vacc: 5 kV; Mag: 1,000X
Pressure: 40 Pa; Signal: UVD
The user-friendly GUI as well as accurate and fast Auto Focus Control (AFC) and Auto Brightness and Contrast Control (ABCC) algorithms, take only 5 seconds to enable optimized imaging performance with minimal time and effort.
The “SEM MAP” function makes traversing across an entire specimen effortless. Navigate your sample with the use of an optical camera, and deliver accurate correlated Optical and SEM images using only one click.
The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi’s own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
The VIEW MicroLine® Metrology Systems is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
Lotix is the ultimate solution for waste water, drinking and surface water, ground water, sea water, and other hard to oxidize matrices with an economical price to fit any budget.
When coupled to a compatible autosampler, the ASXPRESS PLUS Rapid Sample Introduction Accessory minimizes times for sample delivery, stabilization, and washout with ICP-AES or ICP-MS.
AC Analytical Controls®, the global SIMDIS market leader, provides a full range of solutions that accurately determine true boiling point data from naphtha up to crude oil samples.
You may contact our specialists by accomplishing form below.
You may contact our specialists by accomplishing form below.
