The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.

The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.