The VIEW MicroLine® Metrology Systems is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
This modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
StarLite™ systems are programmable semi-automatic video measurement systems. A motorized 6.5:1 zoom lens and motorized Z axis make StarLite systems far more capable than what is typically considered a manual system.
Cobra™ Laser Profiling systems from OGP use low-power laser lights to measure height, area, slope, and radius. These laser profilers are ideal for a variety of applications where non-contact measurement is critical to ensure integrity for your parts while measuring to precise accuracies.
The XM66 moisture analyzer offers the option to store four weighing results which make it possible to calculate the ash residue after ashing of the specimen has been completed externally.
ZA3000 series developed to meet user’s needs is a new elemental analysis instrument which employs the technology unachievable by other atomic absorption spectrophotometers so as to enhance the functionality and reliability while preserving the basic performance
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