Under Seiwa Optical and Correct Tokyol, superscopes were designed and manufactured various models for semiconductors, LCD assembly and more.
Standard Configuration with C-mount Camera port that is designed for probe station for semiconductors and for LCD assembly
Customizable design is made to order. Please specify desired operation wavelength at time of order.
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.​
Leading Edge Sensitivity (800 or better RMS); Ease of Use / Stand-alone Operation (no PC required); Optional PC Operation; Fluorescence Spectrophotometer…
The EMIA-Pro Carbon/Sulfur Analyzer is based on HORIBA’s widely respected expertise in Non-Dispersive Infrared (NDIR) technology.
Hitachi’s Dynamic Mechanical Analyzer DMA7100 is ideal for routine and high-level research. Navigation guide and intuitive sample clamping allow simple operation.​..
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
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You may contact our specialists by accomplishing form below.