The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy.
UH5700
UV-Visible/NIR Spectrophotometer
Opening the way to the future, the UH5700, the spectroscopy specialist, handles the ultraviolet, visible, and near-infrared regions and strongly supports you...
ZA3000 series developed to meet user’s needs is a new elemental analysis instrument which employs the technology unachievable by other atomic absorption spectrophotometers so as to enhance the functionality and reliability while preserving the basic performance
SU9000
Ultra-high Resolution Scanning Electron Microscope
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate Scanning Electron Microscope with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis.
Regulus Series
Ultra-high Resolution Scanning Electron Microscope
As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform.
SU7000
Ultra-High-Resolution Schottky Scanning Electron
This modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
SU5000
Schottky Field Emission Scanning Electron Microscope
Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes.
SU3800/SU3900
Scanning Electron Microscopes
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
FlexSEM 1000 II
Scanning Electron Microscope
The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
TM4000II / TM4000Plus II
Tabletop Microscopes
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products.
HF5000
Field Emission Transmission Electron Microscope
The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
HD-2700
Spherical Aberration Corrected STEM/SEM
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously.
HT7800 Series
Transmission Electron Microscope
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high resolution.
NE4000
Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC
The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components.
NP6800
Nanoscale Device Characteristics Analysis System Nano-Prober
The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond.
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