ElemeNtS Analyzes a Wide Application Range all in one Instrument
Improved Lab Productivity Through Reduced User Intervention
Application Specific Configurations Provides Excellent Precision
Proven Compliancy for Multiple Industries
PAC Antek Elements SSA (Single Shot Autosampler) Operation
ElemeNtS Accessories Overview
ElemeNtS brochure
Elements Datasheet
ASTM D4629 Trace Nitrogen in Liquid Hydrocarbons
ASTM D5453 Total Sulfur in Light Hydrocarbons
Tier 3 Compliancy ElemeNtS
Nitrogen Interference kit
Accura Multiloop Calibration
ASTM D6667 Total Volatile Sulfur in Gaseous Hydroc
ASTM D7183 Total Sulfur in Aromatic Hydrocarbons
ASTM D7184 Ultra-low Nitrogen in Aromatics
EN 15486 Sulfur Content of Ethanol
ISO 20846 Sulfur content in automotive fuels
DIN 51444 Nitrogen Determination by Combustion and
Total Analysis of Sulfur and Nitrogen in BioFuel
Total Sulfur in Biofuels – ASTM D5453
Diatomic Nitrogen Interference
LOD calculation according ISO 11843
Septum change on ElemeNtS
This is a simultaneous oxygen, nitrogen & hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology’s R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user’s requests.
The EMIA-Pro Carbon/Sulfur Analyzer is based on HORIBA’s widely respected expertise in Non-Dispersive Infrared (NDIR) technology.
SCP SCIENCE provides a comprehensive range of Standards, Reagents and Reference Materials (RMs) for most inorganic analytical methods. Popular products as well as many difficult to find reagents are available in a large variety of volumes, normalities and molarities.
The PHEMOS-1000 is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by semiconductor device defects.
The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
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