Hitachi Ion Milling System ArBlade 5000 – Sigmatech Inc. Phillipines
The most advanced broad ion milling system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
The most advanced broad ion milling system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.
The innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
Designed and built to Hitachi’s extraordinary standards, the Hitachi MC1000 Ion Sputter Coater is poised to perform in your lab for years to come.
The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
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