The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The LAI‑2200C Plant Canopy Analyzer uses a non-destructive method to easily and accurately measure Leaf Area Index (LAI). It consistently outperforms other methods such as Ceptometry and Hemispherical Photography in terms of flexibility, advanced features, accuracy, and ease of use.
The Aridus3 can enhance analyte sensitivity up to 10 times or more ​​​and can greatly reduce solvent-based interferences such as oxides and hydrides
SNAPâ„¢ Large FOV Video Measurement Systems are compact measuring systems that integrate perfectly from the shop floor, to the lab, or as part of an automated work cell. Rugged construction and an open work envelope make SNAP easy to implement in virtually any manufacturing setting.
Alcor’s JFTOT IV is the globally recognized standard jet fuel thermal oxidation tester, with a worldwide installed base over 1000 instruments of various generations of JFTOT instruments and over 40 years of experience in the industry.
The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
This is a simultaneous oxygen, nitrogen & hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology’s R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user’s requests.
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