The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
HORIBA’s unique compact meter integrates the electrode, display and sample container to enable simple, effective on-site testing by direct measurement from a single drop.
The XM66 moisture analyzer offers the option to store four weighing results which make it possible to calculate the ash residue after ashing of the specimen has been completed externally.
The ASX-7000 OEM autosampler was developed to handle the specific requirements of OEM customers needing robust, high-precision automation.
Higher Resolution – 325 mm focal length monochromators provide superb accuracy and excellent stray light rejection with minimum step size; Faster measurements – increased scan speeds and leading performance
An economic X-ray inspection that is ideal for checking the bonding status of mounting boards such as BGA. It is compatible with M size boards and is equipped with a viewpoint tracking function from the tilt direction as standard equipment.
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