Stuart Evaporator/Concentrator for Block Heaters
Sample concentrator helps produce fast, efficient evaporation
The signal detection from backside facilitates the use of probing and probe card to the wafer surface, and the sample setting can be performed smoothly. The platform, possible to mount multiple detectors and lasers, enables the selection of the optimum detector for performing various analysis methods such as light emission and heat generation analysis, IR-OBIRCH analysis, and others; moreover, letting dynamic analysis perform efficiently by tester connection.
Features:
Sample concentrator helps produce fast, efficient evaporation
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