iPHEMOS-MP

Inverted Emission Microscope

The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.

 

The signal detection from backside facilitates the use of probing and probe card to the wafer surface, and the sample setting can be performed smoothly. The platform, possible to mount multiple detectors and lasers, enables the selection of the optimum detector for performing various analysis methods such as light emission and heat generation analysis, IR-OBIRCH analysis, and others; moreover, letting dynamic analysis perform efficiently by tester connection.

 

Tags: Hamamatsu iPHEMOS-MP Inverted Emission Microscope - Sigmatech Inc. Philippines

Example of connection to the LSI tester

iPHEMOS-MP example of connection

Features:

  • Multi-camera platform with high-precision stage
  • Flexible system design
  • Multiple detectors suitable for observing low voltage operating IC
  • Variety of lens selection from 1× to 100×  (Optional 10-lens turret available.)
  • Backside observation prober available for measurements from an entire 300 mm wafer to a single die
  • Simplified tester head docking for dynamic analysis
  • User friendly operation system
  • Easily upgradable for future application
  • High-resolution pattern image by confocal microscope
Sigmatech Inc. Philippines is the leading provider of cutting-edge laboratory equipment crucial for a wide range of applications, including Quality Assurance/Quality Control (QA/QC), Metrology, Research and Development (R&D), Failure Analysis, Environmental and Chemical Analysis, and Process Control. Serving diverse industries in the Philippines, such as Semiconductor/Electronics, Pharmaceutical, Mining, Energy, and more, we are your go-to source for top-quality equipment, including Inverted Emission Microscopes in the Philippines About us

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