Pinnacle Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/
The PHI Quantera II is an XPS instrument which can produce a micro-focused, raster scanned x-ray beam with a minimum beam size of 7.5 μm in diameter.
Cobraâ„¢ Laser Profiling systems from OGP use low-power laser lights to measure height, area, slope, and radius. These laser profilers are ideal for a variety of applications where non-contact measurement is critical to ensure integrity for your parts while measuring to precise accuracies.
Every lab can now produce accurate chip-offs, reproducible pre-cavitated devices — ready for testing or final decapsulation with chemicals or plasma.
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