OptiFlash: Pensky Martens, Cleveland Open Cup, Tag & Abel Flash Point Analyzers
Cobraâ„¢ Laser Profiling systems from OGP use low-power laser lights to measure height, area, slope, and radius. These laser profilers are ideal for a variety of applications where non-contact measurement is critical to ensure integrity for your parts while measuring to precise accuracies.
The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
ARC-lite is the only system to offer fast, reliable, room temperature Anti Reflective Coating on package and wafer level devices. ARC-lite is used as a free-standing unit for AR coating polished backside surfaces. The sample produced are optimized and require no baking.
Automatic ashing and drying systems (macro TGA) Series 340 prepASH®
The LI-193 Spherical Underwater Quantum Sensor measures PAR in air or underwater from all directions at depths up to 350 meters.
Higher Resolution – 325 mm focal length monochromators provide superb accuracy and excellent stray light rejection with minimum step size; Faster measurements – increased scan speeds and leading performance
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