Hamamatsu PHEMOS-X Emission Microscope
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
Specification
| Item | Description |
|---|---|
| Operation mode | Stand-alone or PC operation |
| Light source | 150W Xenon lamp (self-deozonating lamp house) |
| Photometric principle | Monochromatic light monitoring ration calculation |
| Sensitivity | 800 or more (RMS) (bandpass 5nm, response time 2 S) |
| Bandpass | 2.5, 5, 10, 20 nm (both Ex and Em) |
| Wavelength scan speed | 60 – 3,000 nm/min (four steps), 12,000 (when PC control) |
| Dimensions / Weight | 600 (w) x 503 (D) x 343 (H) mm/ approx.41 kg |
| Power consumption | AC100, 115, 220, 230, 240 V 50/60 Hz 400 VA |
Fluorescein Measurement
Owing to the F-2700’s high sensitivity and wide dynamic range (about six orders of magnitude),
low concentration and small volume samples can be analyzed effectively.
See more at Hitachi High-Tech’s website
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
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