Hamamatsu PHEMOS-X Emission Microscope
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.
Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
This compact analyzer has a range of 0 to 5 wt% of total sulfur, with a lower detection limit of 20 ppm and repeatability of 15 ppm. Accuracy is ensured by storing up to five calibration curves and an alphanumeric keyboard input aides in identifying samples.
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
Several improvements and enhancements have been made to the latest HORIBA LAQUA handheld meters allowing sustained periods of operations in challenging outdoor conditions and making the 200 series a compact yet powerful versatile water quality meters.
Herzog’s automated Ubbelohde viscometers offer stability, ease of use, repeatability, and high sample throughput.
The VIEW MicroLine® Metrology Systems is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
MULTIPOL Advance is a versatile lapping and polishing systems capable of preparing some of the most demanding specimens required by Research and Industry.
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