QVI VIEW MicroLine AF Plus Metrology Systems
The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
 
 
 
 
 
 
 
 
Package Details:
PC210-KN: Kit with pH 4.01Â and 6.86 NIST buffers (60ml each) is available upon request.
The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
ZA3000 series developed to meet user’s needs is a new elemental analysis instrument which employs the technology unachievable by other atomic absorption spectrophotometers so as to enhance the functionality and reliability while preserving the basic performance
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products.
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously.
You may contact our specialists by accomplishing form below.
You may contact our specialists by accomplishing form below.