Horiba MESA-7220V2 X-ray Fluorescence (XRF) – Sigmatech Inc. Philippines
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method.
Plant growth and reproduction are driven by photosynthetically active radiation (PAR), defined as wavelengths between 400 and 700 nanometers. This interval is often separated into three distinct “color” bands for plant research. Modifying the intensity of red, blue, green wavelengths, along with additional near-UV (380-400 nm) and far-red (700-780 nm) bands, can influence a variety of plant characteristics, such as growth rate, chemical composition, and more.
The precision linear image sensor of the LI-180 records intensity and composition of these five wavebands at the single-nanometer level with a single click. Optimize the composition of your supplemental lighting and track your spectrometer data over time for long-term validation of your lights and lighting strategy. Monitor degradation of your custom lighting system, plan for seasonal changes or upgrades, and design species-specific light recipes using the LI-180 Spectrometer.
Measure real-time changes from spectral manipulation, height adjustment, and plant positioning. In one click, the LI-180 records dozens of variables including PAR (as color-specific photosynthetic photon flux density (PPFD)), photon flux density (PFD), irradiance (W/m2), and more. Select a measurement to see details, such as ratios of red to blue or red to far-red intensity.
Compare the spectra of your lighting to one of multiple reference spectra. Reference spectra are based on pigments important for photosynthesis and morphology, such as chlorophyll a or beta carotene. Then adjust your lighting strategy to better match the pigment peaks for species-specific responses throughout your greenhouse.
Measure spectral output from any angle in and around your plants to find optimal spacing and height of supplemental lighting. The full capability of the LI-180 is within a compact, lightweight design that fits in the palm of your hand. Save your data to a high-capacity SD card or transfer data files via email from the mobile application.
Measure specific wavebands of interest and view the results in tabular and graphical outputs immediately after capture. Create custom wavebands and ratios to focus on the light ranges you want. Determine which bands of light have the highest intensity from your lighting strategy.
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method.
Sample Prep Station APS-7450V
The PHEMOS-1000 is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by semiconductor device defects.
Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface.
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