The VIEW Summit metrology systems are designed for components requiring a large work envelope and high accuracy. Based on the same core technologies of optics, high speed linear motors, and high resolution scales used in the VIEW Pinnacle, the Summit features a fixed bridge design.
The LI-3000C Leaf Area Meter is a lightweight, non-destructive instrument to get leaf area measurements where you need to.
The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The Quorum Coolstage is a Peltier-cooled cooling stage for scanning electron microscopy (SEM), low vacuum (LV) or variable pressure (VP) applications.
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