The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
Developed with the user in mind, the AminoSAAYA offers easy and comfortable operability while maintaining the reliability and stability of Hitachi’s legacy amino acid analyzers.
The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues, and a multitude of other applications.
The most advanced broad ion milling system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
The E3100 large chamber critical point dryer has been an industry standard for over 35 years and is used in numerous scanning electron microscopy (SEM) laboratories around the world.
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