The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The Q150 GB is a modular glove box version of the highly successful Q150T ES Plus bench top turbomolecular-pumped coating system – suitable for SEM, TEM and many thin-film applications.
The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues, and a multitude of other applications.​
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
An economic X-ray inspection that is ideal for checking the bonding status of mounting boards such as BGA. It is compatible with M size boards and is equipped with a viewpoint tracking function from the tilt direction as standard equipment.
The HORIBA LAQUA Benchtop Water Quality Meters were developed as durable meters offering long term reliability for laboratory professionals. Advanced functionalities and a wide array of electrodes provide high precision measurement with improved response time in a huge variety of applications.
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