Hamamatsu PHEMOS-X Emission Microscope
The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
Integrated fully motorized digital microscope with 12x optical zoom. Included Seiwa InSight software provides features for high precision measurements, documentation and traceable report generation as required by industrial, scientific and biomedical applications.
Features include:
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The PHEMOS-X is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
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