The lightweight, ergonomic pipette controller features two main function buttons for complete control over filling and delivery. An integrated speed control dial allows you to adjust continuously how slowly or quickly you want to take up liquid, while a simple flick of a switch changes the dispensing method from power assisted to non-power assisted.
Built-in non-return valve combined with a membrane filter protects against penetration of liquids. To protect the controller from internal corrosion, vapors are expelled from the front of the unit, away from the operator and not through the pump. The silicone adapter included with the controller provides a tight fit for all graduated and volumetric glass or plastic pipettes in the volume range of 0.1 mL to 200 mL. The adapter along with the filter and nosepiece are autoclavable at 250°F (121°C).
A rechargeable NiMh battery provides up to 8 hours of nonstop pipetting on a 4-hour charge. LED indicator flashes when 2 hours of pipetting time remain.
The VIEW Benchmarkâ„¢ 300 is engineered for high performance and reliability in a floor model package. Advanced optics, illumination, image processing, and available Continuous Image Capture make VIEW Benchmark a world-class metrology system.
The Hitachi NE4000 nanoEBAC is an electron beam based probing system for electrical characterization and EBAC analysis and imaging of microelectronic device interconnects, materials, and components.​
Handheld water quality meters that measure pH, conductivity, resistivity, salinity and TDS. Waterproof, dust proof, eco-friendly, shock and scratch resistant and built for hands-free testing. With phone jack output for connecting the meter to computer for software upgrades and RS232 cable for printer printout. GLP compliant.
This is an hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology’s R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user’s requests.
With the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.
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