three 25-mm PTFE-coated stir bars.
Units only require one power source — ideal for quality control applications where multiple samples require processing under the same conditions.
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
With the 360 ES series Precision balances, Precisa is setting new standards: innovative, high-tech instrumentation which includes the latest technical developments, unique performance features, best user-interface and the most modern design to establish the 360 ES series as the very bench-mark for modern laboratory technology.
Alcor’s JFTOT IV is the globally recognized standard jet fuel thermal oxidation tester, with a worldwide installed base over 1000 instruments of various generations of JFTOT instruments and over 40 years of experience in the industry.
A new type of MESA-50 XRF with a big sample chamber has been added to the MESA-50 series. It is equipped with the sophisticated LN2-free detector. As/Sb analysis function and Multilayer Film FPM are available as options.
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