
Hamamatsu iPHEMOS-DD Inverted Emission Microscope
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
In-line automatic inspection equipment for electronic board X-ray inspection.
PAC’s AC Analytical Controls offers a full range of Detailed Hydrocarbon Analyzers (DHA) to determine individual hydrocarbon composition in light hydrocarbon streams, gasoline blending feedstocks and spark ignition engine fuels.
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