The Fusion Total Organic Carbon (TOC) Analyzer and TekLinkâ„¢ Software offer solutions for increased sample throughput while improving the reliability of the analysis data. A few of the features that provide increased ease of use are:
Suitable for multi-layer sequential sputtering of two materials, the Q300T D Plus has two independent sputtering heads, which allows sequential sputtering of two metals without the need to break vacuum.
The ACCURA sampling device is designed for fully automated analysis of gaseous and pressurized liquid hydrocarbon streams for MultiTek and Gas Chromatography applications.
Herzog’s automated Ubbelohde viscometers offer stability, ease of use, repeatability, and high sample throughput.
Its large sample holder and scan area, high spatial resolution, fast acquisition speed and large bandwidth make it a powerful lab instrument for high resolution R&D applications and at the same time a perfectly suitable instrument for high volume quality control in production environment.
The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues, and a multitude of other applications.​
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