0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration. The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series.
The new high-stability Cold FEG uses a thoroughly redesigned version of Hitachi’s long-established cold field-emission electron source technology.
Total system stability has also been optimized in order to achieve sub-Å imaging. The column, power supplies and specimen stage have all been newly designed to offer the very best mechanical and electrical stability. Combining these capabilities with Hitachi’s unique fully-automated probe-forming Cs-corrector, just requiring a single click of a mouse, ensures all users can reach the very best performance quickly and easily.
Si(211) single crystal HAADF-STEM image (left), image intensity profile (right lower) and FFT power spectrum (right upper)
High-sensitivity, high-throughput EDX is achieved with symmetrically opposed dual 100 mm2 SDDs.
The symmetrical dual SDD configuration results in an almost constant count rate when tilting. On crystalline samples, EDX acquisition can be performed simply with the zone axis aligned, compared with single detector configuration.
The large solid angle also means that EDX mapping can be achieved even on beam-sensitive and/or low X-ray yield specimens, including atomic column mapping. High pixel resolution EDX with wide field of view is also achievable, providing large high-resolution datasets.
GaAs (110) atomic column EDX elemental mapping
Simultaneous SEM & STEM imaging is offered as standard, with ET-type SE detector.
This enables the correlation of surface and internal information with insights into the 3D structure of the specimen, without the need to perform 3D tomography.
Additionally, the Cs-corrected SEM image offers higher spatial resolution with more faithful surface information
Au/CeO2 catalyst SEM/ADF-/BF-STEM images (upper), and respective high resolution Au particle images (lower).
Water quality analysis is repeatedly performed in laboratories on a daily basis. Our high-end benchtop model was developed to provide simplicity with excellent on-site usability – from operation and maintenance through to troubleshooting.
When coupled to a compatible autosampler, the ASXPRESS PLUS Rapid Sample Introduction Accessory minimizes times for sample delivery, stabilization, and washout with ICP-AES or ICP-MS.
The Analyte HE Laser Ablation System offers excimer technology at 193 nm with all the analytical capabilities you require, delivering finely controlled, “homogenized-flat” ablations with high sensitivity and split second response.
The only photosynthesis system capable of measuring combined gas exchange and fluorescence from leaves and aquatic samples.
The LI-3100C Leaf Area Meter is a rugged bench-top instrument designed to quickly digitize the area, length, and width of leaves.
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