VIEW MicroLine 300

The VIEW MicroLine 300 from QVI is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices. This capable desktop instrument provides precises automated field-of-view measurement of features ranging in size from 0.65 µm  to 400 µm on parts up to 200 mm.

  • Motorized autofocus for optimum image quality
  • Programmable light intensity
  • Robust capabilities for measuring transparent layers, lines eith irregular edges and more.

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