The mainstay of shop-floor measurement, optical comparators’ tough construction and big viewing screens make measurements fast and easy. Contour Projectors® Horizontal Optical Comparators from OGP offer the industry’s best value and performance for non-contact measurement. All OGP benchtop and floor model comparators use cutting-edge optical, lighting, and automation technologies, allowing for tight tolerances and a wide range of manufacturing process applications.
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| Features | Focus | QL-20 | QL-30 |
| Screen Size (viewable) | 14″ | 20″ | 30″ |
| XY Travel | |||
| Standard | 12” x 5” | 15” x 9” | |
| Optional | 15” x 5” | 15 x 10”, 18” x 9”, or 18” x 10” | |
| Z Focus Travel | 1.5” (1.25” with optional oblique ringlight) | 3” | |
| XY Drive | |||
| Manual | x | – | – |
| Motorized | * | x | x |
| Optics | Telecentric, upright and reversed | Telecentric, upright and un-reversed | |
| Optical Lens | |||
| Turret Lens | Standard 3-position turret | Standard Fixed 1-position turret, Optional Motorized 5-position turret | |
| Standard | 10x Lens | ||
| Optional | 20x, 31.25x, 50x, 100x | 20x, 31.25x, 50x, 62.5x, 100x | |
| Maximum Load Capacity | 45 lb | 350 lb | |
| Helix Angle Range | |||
| Standard | +/- 6.5 degrees | – | – |
| Optional | – | +/- 7.5 degrees | +/- 7.5 degrees |
| Throat Clearance | 10” (9” with optional oblique ringlight) | 19” | 21” |
| Illumination | |||
| Profile | x | x | x |
| Oblique | * | – | – |
| Coaxial | * | * | * |
| Illumination Type | LED | LED | Mercury Arc |
| Projectron Edge Detection | * | * | * |
| eCAD® | – | * | * |
| VidiProbe | * | * | * |
| DRO | |||
| Q-Check® | x | x | x |
| Q-Touch™ | * | * | * |
| Software | |||
| SNAP-X™ Measure | ** | ** | ** |
| SNAP-X™ Compare | ** | ** | ** |
| SNAP-X™ Analyze | *** | *** | *** |
| eChek™ | * | * | * |
| OGP EVOLVE® SPC | * | * | * |
| x– Standard ; * – Optional; ** – Included with VidiProbe; *** – Optional with VidiProbe | |||
A high vacuum evaporator for TEM, SEM and thin film applications
HORIBA’s unique compact meter integrates the electrode, display and sample container to enable simple, effective on-site testing by direct measurement from a single drop.
The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
Our LAQUA benchtop models were developed to provide simplicity with excellent on-site usability – from operation and maintenance through to troubleshooting.
The SEMCool is based on the PP3006 CoolLok but without the PP3004 QuickLok components. It is designed for cryogenic applications where airlock exchange of specimens into the microscope is not required.
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