All SNAP systems feature large field of view optics, high resolution cameras, and lighting custom-designed to optimize the image, creating a complete optical system. Camera, optics, lighting, and platform are matched and tuned for optimum performance.
SNAP-X software provides users with a simple, powerful interface for instant 2D measurement, virtual chart gaging, and profile analysis. Optional ZONE3 software combines Parallel Processing with intelligent routine Optimization resulting in faster programming and run times by measuring as many features as can be seen simultaneously.
BENEFIT |
FEATURE |
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Delivers a much larger area of measurement without stage movement, ideal for small parts with fine features | Video system with field sizes similar to traditional optical comparators |
Automatic measurement of single parts, multiple parts – even a mixture of different part, producing high accuracy images | High- resolution digital metrology camera with specially designed optics and lighting |
Instant 2D measurement, virtual chart gaging, and profile analysis | SNAP-X software has major functions that focus on core tasks |
Measure details anywhere in the viewing area | Exclusive Zoom Anywhere technology |
Advanced programming techniques and full-field parallel processing | Optional ZONE3 Metrology Software |
Combines a high resolution digital metrology camera with specially designed optics and lighting to produce high accuracy images, even in shop-floor conditions
Extends measuring range with a precision motorized X-axis stage, and the flexibility of two built-in optical magnifications
Offers extended X and Y measuring range and dual magnification optics for large and small feature measurements
Offers a 100 mm field of view with expansive XY stage travel to measure dimensions of large parts with critical details or numerous small parts automatically
Its large sample holder and scan area, high spatial resolution, fast acquisition speed and large bandwidth make it a powerful lab instrument for high resolution R&D applications and at the same time a perfectly suitable instrument for high volume quality control in production environment.
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