BENEFITS |
FEATURES |
|---|---|
| Versatile – Optimize mag for the measurement | Motorized zoom lens with 6.5:1 ratio |
| Engineered for video edge detection metrology | High-resolution color camera |
| Create the optimum image contrast for video measurement | Green LED illumination for backlight, white coaxial surface light and programmable 7 sector / 6 ring VectorLight™ |
| Generous clearance for parts and fixtures | Working distance of 62 mm (2.44″) with standard configuration |
| Speed, accuracy, durability | Precision transports with a granite platform |
Automatic benchtop video measurement machines with high performance and affordability
Large capacity, fully automatic, 3-axis dimensional video measuring systems featuring high precision and capacity in a compact footprint
With a massive granite base for stability, this large capacity, fully automatic, 3-axis dimensional video measuring systems has a moving bridge, ideal for large heavy parts
Automatic, non-contact video measurement systems with moving bridge design and eleven different large capacity travel ranges
The K850WM Critical Point Dryer is a compact, bench-top instrument designed to critical point dry a complete 6″/150 mm wafer. A convenient wafer holder allows rapid transfer and ensures that pre-drying does not occur.
Equipped with an original direct conversion X-ray camera, NEO-6100Z / 8100Z make it possible to inspect images that are clear and have little deterioration in brightness.
The iPHEMOS-MPX is a high-resolution emission microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
SprintMVP™ – Programmable Multi-Sensor Video Metrology System – Utilizing a 6.5:1 motorized, programmable zoom lens allows the user to focus at the optimum magnification. High speed, high accuracy stage on an all granite platform for thermal stability.
Based on many years of customer input and product development, ASAP-1® IN SITU is a single-footprint milling and sample prep system that can incorporate RST Measurement System –allowing measurement of the thickness of remaining silicon without sample transfer.
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