Based on many years of customer input and product development, ASAP-1® IN SITU is a single-footprint milling and sample prep system that can incorporate RST Measurement System –allowing measurement of the thickness of remaining silicon without sample transfer.
With the improved analyzer and input lens, the VersaProbe III has achieved three times as high sensitivity as conventional technologies, enabling even higher throughput and the best possible micro XPS analysis.
An ever-increasing demand for ultrathin TEM lamellas without artifacts during FIB processing require the best in ion and electron optics technologies.​
The IS-202 Scanning Acoustic Microscope is ideally suited for mid-volume lab applications where high resolution and data acquisition flexibility are crucial to obtain high quality scanning results. Due to its small dimensions this desktop scanner easily fits in every laboratory environment.
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