The VIEW Benchmarkâ„¢ XLT delivers VIEW performance and reliability in a large travel, non-contact, high precision metrology system.
The Benchmark XLT is designed to handle large area parts or nested groups of smaller parts using its moving bridge design. Advanced image processing allows the Benchmark XLT to operate with high speed, accuracy and robustness.
Benchmark XLT operates with one or more of VIEW’s software packages:
The VIEW Benchmark™ 450 delivers VIEW performance with generous measuring envelopes. Benchmark 450 embodies the ideal configuration of SMT assembly metrology when configured with VIEW’s unique Elements software.
The inverted emission microscope is a backside analysis system designed to identify failure locations by detecting the light and heat emitted from the defects in semiconductor devices.
Safe and accurate flash point determination for low volume samples. The new Small Scale Flash Point Analyzer completes PACs Herzog OptiFlash family.
The technology for spectrophotometers continues to advance. Hitachi designs double beam spectrophotometers encompassing technologies for the future.​
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