MicroLine systems feature the highest quality microscope optics, motorized autofocus, manually operated stages and fully programmable illumination and measurement recipes. Reflected illumination is standard and transmitted illumination is available as an option. MicroLine systems are capable of measuring bright and dark lines, semi-transparent layers, lines with irregular edges and other critical features.
The MicroLine systems are well suited to measure wafers, masks, MEMS, and other micro-fabricated parts. These capable desktop instruments provide precise optical measurement for features as small as 0.5 microns on parts up to 300 x 300 mm. With its advanced lighting and optics, the MicroLine boasts robust capabilities for measuring transparent layers, lines with irregular edges, and more.
Several improvements and enhancements have been made to the latest HORIBA LAQUA handheld meters allowing sustained periods of operations in challenging outdoor conditions and making the 200 series a compact yet powerful versatile water quality meters.
The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.
Cobra™ Laser Profiling systems from OGP use low-power laser lights to measure height, area, slope, and radius. These laser profilers are ideal for a variety of applications where non-contact measurement is critical to ensure integrity for your parts while measuring to precise accuracies.
The IR-2200 Infrared Microscope system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.
With the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.
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