Horiba XGT-9000 Micro-XRF (micro-X-Ray Fluorescence) – Sigmatech Inc. Philippines
Next evolution of (Micro-XRF) micro-X-Ray Fluorescence Spectroscopy; Ultimate performance in speed and flexibility
The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.
The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.
The Pinnacle operates with one or more of VIEW’s standard metrology software packages:
Next evolution of (Micro-XRF) micro-X-Ray Fluorescence Spectroscopy; Ultimate performance in speed and flexibility
The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy.
The XM66 moisture analyzer offers the option to store four weighing results which make it possible to calculate the ash residue after ashing of the specimen has been completed externally.
You may contact our specialists by accomplishing form below.
You may contact our specialists by accomplishing form below.