ULVAC PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features KEY TECHNOLOGY Triple Focusing Electrostatic Analyzerfor Complex Sample Geometries
Further Developed Pulsed Ion Source ensures high quality results Minimum beam diameter is 70 nm or less Ion source can be selected from gallium, gold,
ULVAC PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features KEY TECHNOLOGY Triple Focusing Electrostatic Analyzerfor Complex Sample Geometries
Further Developed Pulsed Ion Source ensures high quality results Minimum beam diameter is 70 nm or less Ion source can be selected from gallium, gold,
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