[Background] Advanced materials such as all-solid-state batteries, advanced semiconductors, and artificial photosynthesis are complex combinations of materials, and their research and development require speed in
ULVAC PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features KEY TECHNOLOGY Triple Focusing Electrostatic Analyzerfor Complex Sample Geometries
Further Developed Pulsed Ion Source ensures high quality results Minimum beam diameter is 70 nm or less Ion source can be selected from gallium, gold,
SEM resolution ≤ 3 nm, AES resolution ≤ 8 nm In Auger analysis (spectrum, depth profile or mapping), it is necessary to set AES analysis
[Background] Advanced materials such as all-solid-state batteries, advanced semiconductors, and artificial photosynthesis are complex combinations of materials, and their research and development require speed in
ULVAC PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features KEY TECHNOLOGY Triple Focusing Electrostatic Analyzerfor Complex Sample Geometries
Further Developed Pulsed Ion Source ensures high quality results Minimum beam diameter is 70 nm or less Ion source can be selected from gallium, gold,
SEM resolution ≤ 3 nm, AES resolution ≤ 8 nm In Auger analysis (spectrum, depth profile or mapping), it is necessary to set AES analysis
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