Designed and built to Hitachi’s extraordinary standards, the Hitachi MC1000 Ion Sputter Coater is poised to perform in your lab for years to come.

Designed and built to Hitachi’s extraordinary standards, the Hitachi MC1000 Ion Sputter Coater is poised to perform in your lab for years to come.

Overview

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-palladium alloy (Pt-Pd) or gold-palladium alloy (Au-Pd), in order to make the surface of a sample electrically conductive and avoid charge build-up during observation in a SEM. The thickness of the metal deposition is variable from a few nanometers up to tens of nanometers by using the LCD touch screen control. Up to 5 processing conditions can be stored.

The MC1000 operates via a magnetron electrode, which means a magnet is incorporated in the target (negative electrode) to generate a magnetic field perpendicular to the electric field on the target surface. This minimizes specimen damage due to irradiation with fast moving particles (including reflected ions) and allows coating with high granularity (smaller-diameter particles).

Features

  • One-touch operation from the LCD touch panel
  • Saves and recalls up to 5 recipes
  • Magnetron-type electrode decreases specimen damage and reduces average particle size
  • Optional chamber for samples up to 6 in (150 mm) in diameter
  • Optional spacer for samples up to 1.75 in (45 mm) tall
  • Main valve to keep the chamber under vacuum when not in use

Related Products

The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.
The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens.
Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.
Seiwa Wafer review system visually inspects the defect location detected from AOI systems. This review system is able to capture the visual data and add it to previous inspection results.
ULVAC-PHI brings essential surface analysis technologies together in an automated platform for advanced battery thin film and interface characterization.
ULVAC-PHI brings essential surface analysis technologies together in an automated platform for advanced battery thin film and interface characterization.
The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The iPHEMOS-MPX is a high-resolution Inverted Emission Microscope that pinpoints failure locations in semiconductor devices by detecting the weak light emissions and heat emissions caused by defects.
The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.
The Insight-Scan (IS) series of Scanning Acoustic Microscopes(SAM) integrates the finest state-of-the-art technology for high resolution, high speed, fully digital non-destructive sample analysis.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
STA (simultaneous thermogravimetric analysis) measures DSC and TGA simultaneously in a single unit.
The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.
DSC is used to measure heat flow for material characterization by providing thermal properties such as melting point, glass transition and crystallization.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

MC1000
Ion Sputter Coater
MC1000
Ion Sputter Coater