Hitachi IM4000II Ion Milling System
High Milling Rate The cross section milling rate of the IM4000II is 500 µm/h or greater. It is effective for hard materials that conventionally require extended
High Milling Rate The cross section milling rate of the IM4000II is 500 µm/h or greater. It is effective for hard materials that conventionally require extended
ULTRA TEC ASAP-1 Selected Area Sample Preparation System In recent years, driven by exponential growth of newer packaging types; CSP, MCM, BGA, flip chip to
The specific workholder for an application is held firmly and repeatably with the system’s quick release interface. Standard holders are available for many applications, including:
ULTRAPOL Basic polishing and lapping machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in
ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES ULTRASLICE Macrotome precision diamond saw has a quiet,
Overview The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit
Hitachi ArBlade 5000 Ion Milling System Features Cross-section milling rate: 1 mm/hour!*1 The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a
High Milling Rate The cross section milling rate of the IM4000II is 500 µm/h or greater. It is effective for hard materials that conventionally require extended
ULTRA TEC ASAP-1 Selected Area Sample Preparation System In recent years, driven by exponential growth of newer packaging types; CSP, MCM, BGA, flip chip to
The specific workholder for an application is held firmly and repeatably with the system’s quick release interface. Standard holders are available for many applications, including:
ULTRAPOL Basic polishing and lapping machine offers the build-quality required for high precision manual polishing of materials for production, research and NAND flash chip-off in
ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES ULTRASLICE Macrotome precision diamond saw has a quiet,
Overview The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit
Hitachi ArBlade 5000 Ion Milling System Features Cross-section milling rate: 1 mm/hour!*1 The ArBlade 5000 is equipped with a fast-milling Ar ion gun with a
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