ULTRA TEC Ultraslice Macrotome Precision Diamond Saw - Sigmatech Inc.

Failure Analysis, Material Characterization, Metrology Equipment

Sample Preparation

Precision Diamond Saw

Ultraslice Macrotome

LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

Suits Low Budgets
Manual Crank Table Feed, with motor option
Z-Spindle Option adds easy ability to adapt to sample height
Chip-Off for Digital Forensics
Fish & Game Samples
Industrial Samples

LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS, DEVICES & INDUSTRY SAMPLES

Suits Low Budgets
Manual Crank Table Feed, with motor option
Z-Spindle Option adds easy ability to adapt to sample height
Chip-Off for Digital Forensics
Fish & Game Samples
Industrial Samples

Add to Quote List

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw | LOW COST SECTIONING SYSTEM FOR MOBILE CHIPS & DEVICES

ULTRASLICE Macrotome precision diamond saw has a quiet, safe, direct drive design for smooth, chatter free slicing system for important and fragile industrial samples. The system is perfect for the sectioning of cellphone devices and components to allow for downstream chip-off techniques with our milling and polishing equipment. MACROTOME suits many other industrial applications. If you have such an “other” application, talk to us about it and we can confirm suitability – perhaps by cutting samples. Macrotome may represent a low cost solution for you. The wheel (spindle) rotation is variable speed, to allow for optimized cut quality. An easy access coolant reservoir, allows for efficient coolant changes.

ULTRA TEC Ultraslice Macrotome Precision Diamond Saw

For quotation and more info, contact us.

Product Brochure

Related Products

ArBlade 5000

ArBlade 5000

Ion Milling System

Ion Milling System

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

The top of the line ion-milling system for producing exceptional quality cross section or flat-milling samples for electron microscopy.

Ultraslice Macrotome

Ultraslice Macrotome

Precision Diamond Saw

Precision Diamond Saw

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

Ultraslice Macrotome is a low-cost sectioning system designed for mobile chips, devices, and various industrial samples. This system is known for its precision and versatility.

ZONESEMⅡ

ZONESEMⅡ

Sample Cleaner

Sample Cleaner

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

The ZONESEMⅡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

nanoTOF II

nanoTOF II

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

Time-of-flight Secondary Ion Mass Spectroscope (TOF-SIMS)

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

PHI’s Latest Generation of TOF-SIMS, having a Modern Ergonomic Package, Smaller Footprint, and Advanced Features

SU7000

SU7000

Scanning Electron Micrscope

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis

SU3800 / SU3900

SU3800 / SU3900

Scanning Electron Microscope

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.

PHI nanoTOF ３+

PHI nanoTOF ３+

Time-of-Flight Secondary Ion Mass Spectrometry

Time-of-Flight Secondary Ion Mass Spectrometry

ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.

ULVAC PHI’s Latest Generation of TOF-SIMS, have a Modern Ergonomic Package, Smaller Footprint, and Advanced Features.

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.