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Failure Analysis,
Material Characterization
and Metrology Equipment

Scanning Electron Microscopes, Transmission Electron Microscopes, Atomic Force Microscopes, Raman Microscopes, Thermal Analyzers, FTIR, Failure Analysis Systems, Sample Preparation Equipment, Scanning Acoustic Microscopes, Optical Microscopes, X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and more.

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Failure Analysis, Material Characterization and Metrology Equipment

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Radio Filter Failure Analysis

Failure Analysis, Material Characterization and Metrology Equipment

Checkbox Failure Analysis

Analytical Equipment

Agri-Environmental Equipment

Petroleum Testing Equipment

General Laboratory Equipment

Browse by Brand

Other Categories

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Radio Filter Failure Analysis
Tabletop Scanning Electron Microscope Philippines
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TM4000 Plus

TM4000 Plus

Tabletop Scanning Electron Microscope

Tabletop Scanning Electron Microscope

This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining compact design
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su3900 Scanning Electron Microscope
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1

SU3800 / SU3900

SU3800 / SU3900

Scanning Electron Microscope

Scanning Electron Microscope

Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
Hitachi High-Tech’s scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance.
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Focused Ion and Electron Beam System Ethos NX5000 Series FIB-SEM
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NX5000

NX5000

Focused Ion and Electron Beam System

Focused Ion and Electron Beam System

Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
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1
1

SU8600

SU8600

Ultra High Resolution Cold-FESEM

Ultra High Resolution Cold-FESEM

The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
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Hitachi SU9000 Scanning Electron Microscope SEM
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SU9000

SU9000

Ultra-high Resolution Scanning Electron Microscope

Ultra-high Resolution Scanning Electron Microscope

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam bright
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Hitachi SEM SU7000 Scanning Electron Microscope
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SU7000

SU7000

Scanning Electron Micrscope

Scanning Electron Micrscope

The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis
The SU7000 is the ultimate high-performance all-rounder: an ultra high resolution Schottky FESEM offering nanoscale imaging and powerful analysis
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Hitachi Scanning Electron Microscope Flexsem
Scientific Equipment Manufacturer
Scientific Equipment Manufacturer

Scanning Electron Microscope

Scanning Electron Microscope

FlexSEM 1000 II

FlexSEM 1000 II

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package.
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failure analysis, material characterization, and metrology equipment

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