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Failure Analysis,
Material Characterization
and Metrology Equipment

Scanning Electron Microscopes, Transmission Electron Microscopes, Atomic Force Microscopes, Raman Microscopes, Thermal Analyzers, FTIR, Failure Analysis Systems, Sample Preparation Equipment, Scanning Acoustic Microscopes, Optical Microscopes, X-Ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, and more.

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Failure Analysis, Material Characterization and Metrology Equipment

Checkbox Failure Analysis

Analytical Equipment

Agri-Environmental Equipment

Petroleum Testing Equipment

General Laboratory Equipment

Browse by Brand

Other Categories

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Radio Filter Failure Analysis
Atomic Force Microscope Philippines
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Park Logo

Park FX40

Park FX40

Small Sample Atomic Force Microscope

Small Sample Atomic Force Microscope

The most advanced AFM for small samples
The most advanced AFM for small samples
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Add to Quote
Park NX10 Atomic Force Microscope AFM Philippines
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Park Logo

Park NX10

Park NX10

Small Sample Atomic Force Microscope

Small Sample Atomic Force Microscope

Proven performance in nanoscale metrology.
Proven performance in nanoscale metrology.
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Add to Quote
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Park Logo

Park FX200

Park FX200

Large Sample Atomic Force Microscope

Large Sample Atomic Force Microscope

The most advanced AFM for 200 mm samples
The most advanced AFM for 200 mm samples
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Add to Quote
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Park Logo

Park NX1

Park NX1

Small Sample Atomic Force Microscope

Small Sample Atomic Force Microscope

The highest resolution AFM
The highest resolution AFM
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Add to Quote
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Park Logo

Park NX20

Park NX20

Large Sample Atomic Force Microscope

Large Sample Atomic Force Microscope

The leading nanometrology tool for failure analysis and large sample research
The leading nanometrology tool for failure analysis and large sample research
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Add to Quote
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Park Logo

Park NX12

Park NX12

Specialized Atomic Force Microscope

Specialized Atomic Force Microscope

The ideal choice for biological and electrochemical studies.
The ideal choice for biological and electrochemical studies.
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Add to Quote
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Park Logo

Park NX15

Park NX15

Large Sample Atomic Force Microscope

Large Sample Atomic Force Microscope

The versatile nanometrology tool for advanced research
The versatile nanometrology tool for advanced research
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Add to Quote
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Park Logo

Park NX-Hivac

Park NX-Hivac

Specialized Atomic Force Microscope

Specialized Atomic Force Microscope

The ideal choice for failure analysis and air-sensitive materials research
The ideal choice for failure analysis and air-sensitive materials research
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Add to Quote
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Park Logo

Park Nano-IR Spectrometers

Park Nano-IR Spectrometers

Research Atomic Force Microscope

Research Atomic Force Microscope

AFM-integrated nanoscale IR spectroscopy ​for advanced material characterization
AFM-integrated nanoscale IR spectroscopy ​for advanced material characterization
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Add to Quote
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Park Logo

Park NX-HDM

Park NX-HDM

Industrial Atomic Force Microscope

Industrial Atomic Force Microscope

Industry’s leading automated AFM for high-value wafer metrology solutions
Industry’s leading automated AFM for high-value wafer metrology solutions
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Add to Quote
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Park Logo

Park NX-PTR

Park NX-PTR

Industrial Atomic Force Microscope

Industrial Atomic Force Microscope

Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
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Add to Quote
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Park Logo

Park NX7

Park NX7

Small Sample Atomic Force Microscope

Small Sample Atomic Force Microscope

Accessible nanometrology for academic research
Accessible nanometrology for academic research
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Add to Quote
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failure analysis, material characterization, and metrology equipment

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