The Hitachi TMA7000 Series Thermomechanical Analyzer has doubled its sensitivity compared with our conventional model. It measures a wide range of samples, including thin film and small samples, as it uses the total expansion method and does not limit sample shapes. Changing the modes between push, penetration, and tension is done by simply replacing the probe. A wide range of options, such as an automatic cooling unit, ensures the ease of use and highly accurate measurement.

The Hitachi TMA7000 Series Thermomechanical Analyzer has doubled its sensitivity compared with our conventional model. It measures a wide range of samples, including thin film and small samples, as it uses the total expansion method and does not limit sample shapes. Changing the modes between push, penetration, and tension is done by simply replacing the probe. A wide range of options, such as an automatic cooling unit, ensures the ease of use and highly accurate measurement.

High Sensitivity

TMA7000 is equipped with newly developed “Z-stabilizer” signal optimization technology, which cuts noise levels to achieve highly sensitive measurements.

-

High-Temperature High-Humidity Measurements

Additional options allow measurement under high temperature and high humidity conditions. Furthermore, it is extensible to swelling and vacuum measurements.

The Eco-Friendly Cooling Unit

The eco-friendly cooling unit cuts liquefied nitrogen consumption by approximately 40% (compared to previous models). Electrical cooling units that do not use liquefied nitrogen can also be connected.

-

Effective Atmosphere Control

A mass flow meter can be incorporated into the gas control so the atmosphere can be efficiently controlled by not only the purge gas ON/OFF switch but also programmed flow rate control.

Improved Temperature Control Function

The new built-in temperature control function is designed to reduce the gap between the program temperature and the measurement sample temperature and improve temperature compliance.

Specifications

ModelTMA7100TMA7300
Sample CylinderQuartz, metalAlumina
Temperature Range-170 to 600°CAmbient to 1,500°C
TMA Measurement Range±5 mm
TMA Sensitivity0.01 µm
Load Range±5.8 N
Scan Rate0.01 to 100°C/min
Maximum Sample SizeExpansion; Φ10×L25 mm
Tension; W1×T5×L25 mm
Expansion; Φ10×L25 mm
Sample Length MeasurementAutomated Measurement

Applications

Thermal Expansion of Polyvinyl chloride (PVC)

-

CTE (coefficient of thermal expansion) changes at the glass transition temperature. CTE after Tg is approximately 4 times larger.

Penetration on Polymer film

-

Comparison of softening temperatures between different polymer films, Polyethylene, Polypropylene and Nylon evaluated by penetration measurement.

Anisotropy of Polyethylene (PE) film

-

In above measurements of PE film, tension force is applied in machine direction (MD) and the transverse direction (TD).

Stress-Strain characteristic of Polyethylene (PE) film

-

The measurements are carried out on PE film with strain control mode at different temperature.

Stress-Strain Capabilities

The TMA 7000 series has stress strain measurement and analysis capability. Stress-Strain characteristic, Creep/Recovery, Stress Relaxation can be measured, and furthermore, applying sinusoidal force to samples the dynamic viscoelastic behavior can be characterized.

-

Related Products

Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces
Referenced Spectroscopic Ellipsometry Fast Inspection of Thin Films and Surfaces
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Industry’s leading automated AFM for precise in-line metrology of hard disk head sliders
Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.
Perfect for everyday analysis, it delivers fast, accurate IR measurements for all applications.
Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
Ethos offers powerful solutions integrated into a single platform including low-acceleration Ar/Xe ion-beam processing when configured as a Triple-Beam system.
Industry’s leading automated AFM for high-value wafer metrology solutions
Industry’s leading automated AFM for high-value wafer metrology solutions
Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.
Solution for the review of defects of semiconductor integrated circuit detected by AOI/AVI at front end processing, helps to eliminate false defects and increase overall yield.
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.
The SU8600 incorporates a highbrightness cold-field emitter (CFE) to allow acquisition of ultra-high-resolution images even at low accelerating voltages.

Product added to Quote list ✔

failure analysis, material characterization, and metrology equipment

Subscribe to newsletter

Sign up for our newsletter to get updates on promos, seminars, events, products, application notes and more.

Inquire for this Product

TMA7000 Series
Thermomechanical Analyzer
TMA7000 Series
Thermomechanical Analyzer